Please use this identifier to cite or link to this item:
https://ir.iimcal.ac.in:8443/jspui/handle/123456789/4204
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Gupta, Abhishek | |
dc.date.accessioned | 2022-11-28T14:59:09Z | |
dc.date.accessioned | 2022-11-29T11:21:32Z | - |
dc.date.available | 2022-11-28T14:59:09Z | |
dc.date.available | 2022-11-29T11:21:32Z | - |
dc.date.issued | 2014-10 | |
dc.identifier.uri | https://ir.iimcal.ac.in:8443/jspui/handle/123456789/4204 | - |
dc.description | Biosketch: Abhishek Gupta, PGPEX class of 2015 | en_US |
dc.description.abstract | Measuring technical debt helps us to understand when it is best to engage in mitigation of the technical debt and maximize the total economic value from the software application. New IT processes and tools make it possible for us to measure the quantum of technical debt. A software application can be considered as a production function of a number of function points (unit of measurement to measure the amount of business functionality present in a software application) of an application and the length of the code (measured in terms of KLOC) written to develop the application.The output of this function is the quantitative measurement of quality of the software application represented as total product index. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | MBAEx Magazine Committee, Indian Institute of Management Calcutta | en_US |
dc.relation.ispartofseries | Vol.1; | |
dc.subject | Technical debt | en_US |
dc.subject | Software application | en_US |
dc.subject | IT processes | en_US |
dc.subject | Kilo Lines of Codes (KLOC) | en_US |
dc.subject | Total Quality Index (TQI) | en_US |
dc.title | The eocnomics of technical debts | en_US |
dc.type | Article | en_US |
Appears in Collections: | Volume 1, October 2014 (1st ed.) |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
THE ECONOMICS OF TECHNICAL DEBT.pdf | THE ECONOMICS OF TECHNICAL DEBT | 1.68 MB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.