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Please use this identifier to cite or link to this item: https://ir.iimcal.ac.in:8443/jspui/handle/123456789/1719
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dc.contributor.authorDas, Subrata
dc.contributor.authorDasgupta, Partha Sarathi
dc.contributor.authorPandey Amit
dc.contributor.authorRoy Pabitra
dc.date.accessioned2021-08-26T06:23:46Z-
dc.date.available2021-08-26T06:23:46Z-
dc.date.issued2015
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84936085359&doi=10.1109%2fC3IT.2015.7060206&partnerID=40&md5=dd99ba9c8c7c90bddb2b0950856e9041
dc.identifier.urihttps://ir.iimcal.ac.in:8443/jspui/handle/123456789/1719-
dc.descriptionDas, Subrata, Dept. of Information Technology, Academy of Technology, Hooghly, India; Dasgupta, Partha Sarathi, MIS Group, Indian Institute of Management Calcutta, Kolkata, India; Pandey Amit, Dept. of Information Technology, Academy of Technology, Hooghly, India; Roy Pabitra, Dept. of Computer Science and Engineering, University of Calcutta, Kolkata, India
dc.descriptionISSN/ISBN - 978-147994446-0
dc.descriptionDOI - 10.1109/C3IT.2015.7060206
dc.description.abstractPerformance profiling or empirical testing, and statistical testing of algorithms for NP-complete problems is typically based on random sample testing. Random values constitute a good source of data for testing the effectiveness of a computer algorithm. Random number generation is an absolute proposition. As such, generally the concentration is on realistic pseudorandom number generation. There are numerous pseudorandom number generation algorithms. We propose here another drop in the sea which is at least as efficient as the existing algorithms and simpler in certain respects. © 2015 IEEE.
dc.publisherSCOPUS
dc.publisherProceedings of the 2015 3rd International Conference on Computer, Communication, Control and Information Technology, C3IT 2015
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.subjectAlgorithms
dc.subjectArithmetic algorithms
dc.subjectPseudorandom number
dc.subjectRandom number
dc.titleA close encounter with Random Numbers
dc.typeConference Paper
Appears in Collections:Management Information Systems

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