Please use this identifier to cite or link to this item: https://ir.iimcal.ac.in:8443/jspui/handle/123456789/1668
Title: Business: Do you wanna sell more? Discovering Topics, Sentiments and Prediction of Ratings
Authors: Niyogi, Mitodru
Pal, Asim Kumar
Keywords: Data visualization
Machine learning
Predictive analysis
Sentiment analysis
Text mining
Topic modeling
Yelp reviews
Issue Date: 2017
Publisher: SCOPUS
ACM International Conference Proceeding Series
Association for Computing Machinery
Abstract: In the era of Social Computing, the role of customer reviews and ratings can be instrumental in predicting the success and sustainability of businesses as customers and even competitors use them to judge the quality of a business. Yelp is one of the most popular websites for users to write such reviews. This rating can be subjective and biased toward user’s personality. Business preferences of a user can be decrypted based on his/ her past reviews. In this paper, we deal with (i) uncovering latent topics in Yelp data based on positive and negative reviews using topic modeling to learn which topics are the most frequent among customer reviews, (ii) sentiment analysis of users’ reviews to learn how these topics associate to a positive or negative rating which will help businesses improve their offers and services, and (iii) predicting unbiased ratings from user-generated review text alone, using Linear Regression model. We also perform data analysis to get some deeper insights into customer reviews. © 2017 Association for Computing Machinery.
Description: Niyogi, Mitodru, Govt. College of Engineering and Ceramic Technology, Kolkata, West Bengal, India; Pal, Asim Kumar; Management Information Systems, Indian Institute of Management Calcutta, Kolkata, West Bengal, India
pp.133-138
DOI - 10.1145/3154979.3154987
URI: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85040724726&doi=10.1145%2f3154979.3154987&partnerID=40&md5=2dc4b25da091c9d2079d6be75bc04877
https://ir.iimcal.ac.in:8443/jspui/handle/123456789/1668
Appears in Collections:Management Information Systems

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