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Please use this identifier to cite or link to this item: https://ir.iimcal.ac.in:8443/jspui/handle/123456789/1564
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dc.contributor.authorKanungo, Sayan
dc.contributor.authorRahaman, Hafizur
dc.contributor.authorGupta, Partha Sarathi
dc.contributor.authorDasgupta, Partha Sarathi
dc.date.accessioned2021-08-26T06:23:37Z-
dc.date.available2021-08-26T06:23:37Z-
dc.date.issued2012
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84877768411&doi=10.1109%2fCODEC.2012.6509242&partnerID=40&md5=44b28a4661fa31765228bfd9750ce25c
dc.identifier.urihttps://ir.iimcal.ac.in:8443/jspui/handle/123456789/1564-
dc.descriptionKanungo, Sayan, School of VLSI Technology, Bengal Engineering and Science University, Howrah, India; Rahaman, Hafizur, School of VLSI Technology, Bengal Engineering and Science University, Howrah, India; Gupta, Partha Sarathi, School of VLSI Technology, Bengal Engineering and Science University, Howrah, India; Dasgupta, Partha Sarathi, Indian Institute of Management, Calcutta, Kolkata, India
dc.descriptionISSN/ISBN - 978-146732620-9
dc.descriptionDOI - 10.1109/CODEC.2012.6509242
dc.description.abstractThis work presents an extensive simulation study on different design parameters of an Extended Source Ultra Thin Body Double-Gated Tunneling Field Effect Transistor structure. The study investigates the effects of different device design parameter variations on electrical parameters like: sub-threshold swing, trans-conductance, ON-state current and OFF-state current. Finally an optimum structure for Extended Source Ultra Thin Body Double-Gated Tunneling Field Effect Transistor has been derived from the simulation study, with encouraging results for parameters of interest. © 2012 IEEE.
dc.publisherSCOPUS
dc.publisherCODEC 2012 - 5th International Conference on Computers and Devices for Communication
dc.subjectBTBT
dc.subjectSub-threshold Swing
dc.subjectTCAD
dc.subjectTFET
dc.subjectTrans-Conductance
dc.titleA detail simulation study on Extended Source Ultra-Thin Body Double-Gated Tunnel FET
dc.typeConference Paper
Appears in Collections:Management Information Systems

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